As the back cover of this book says:
"In Risk Management for IT Projects, IT Management experts Ben Lientz and Lee
Larssen show you how to identify and track the recurring issues leading to failure
in IT projects and provide a proven, modern method for addressing them. By following
the recommendations in this book, readers will significantly reduce the risk of
IT failures and increase the rate of success.
While offering a systematic approach to managing risk and issues, Lientz and
- How the issue arises and with what frequency
- What the impacts of the issue are if it does occur
- How to detect specific issues at an early stage
- How to prevent individual issues from occurring
- Detailed actions to take if an issue does arise
Between them Lientz and Larssen have over 75 years of experience dating back
to the 1960s. They have worked with over 150 organizations in over 25 countries
and have seen all of the issues they describe many times.
So, for IT projects people, this is a very handy and practical reference
The authors are to be congratulated on sharing their experiences.
In an Email subsequent to preparation of this review, Bennet Lientz observed:
"I would like to point out that we (the authors) believe that the
standard critical path is highly overrated, since it is not sensitive to the issues
and their severity related to tasks. It only deals with duration and dependencies.
That is why at the start of the book we spent considerable time on issues analysis.
Issues are problems which give risk to the actual or potential impact (risk)."
"We define an issue in terms of being potential, active but not actionable,
active, and resolved. When it becomes active, there is actual risk. When it is
active but not actionable, it has potential or likely risk. If you resolve the
issue, then the risk is mitigated. Risk can only arise due to a problem or issue(s)
not being resolved. To keep the issues tied to the project, we link all issues
to tasks (summary or detailed)."
R. Max Wideman
see description on the back cover.
20. Ibid, p xvi